DocumentCode :
2189314
Title :
CMOS image sensor wafer-level packaging
Author :
Matthias, Thorsten ; Kreindl, Gerald ; Dragoi, Viorel ; Wimplinger, Markus ; Lindner, Paul
Author_Institution :
EV Group, St. Florian am Inn, Austria
fYear :
2011
fDate :
8-11 Aug. 2011
Firstpage :
1
Lastpage :
6
Abstract :
This article presents the advances in wafer-level processing and integration techniques for CMOS image sensor module manufacturing. CMOS image sensors gave birth to the low-cost, high-volume camera phone market and are being adopted for various high-end applications. The backside illumination technique has significant advantages over the front-side illumination due to separation of the optical path from the metal interconnects. Wafer bonding plays a key role in manufacturing backside illuminated sensors. The cost-effective integration of miniaturized cameras in various handheld devices becomes realized through the introduction of CMOS image sensor modules or camera modules manufactured with wafer-level processing and integration techniques. We developed various technologies enabling wafer-level processing and integration, such as (a) wafer-to-wafer permanent bonding with oxide or polymer layers for manufacturing backside illuminated sensor wafers, (b) wafer-level lens molding and stacking based on UV imprint lithography for making wafer-level optics, (c) conformal coating of various photoresists within high aspect ratio through-silicon vias, and (d) advanced backside lithography for various metallization processes in wafer-level packaging. Those techniques pave the way to the future growth of the digital imaging industry by improving the electrical and optical aspects of devices as well as the module manufacturability.
Keywords :
CMOS image sensors; integrated circuit manufacture; integrated circuit packaging; wafer bonding; wafer level packaging; CMOS image sensor module manufacturing; UV imprint lithography; advanced backside lithography; backside illumination technique; conformal coating; cost-effective integration techniques; digital imaging industry; front-side illumination; handheld devices; high-volume camera phone; metal interconnects; metallization processes; optical path; photoresists; polymer layers; through-silicon vias; wafer bonding; wafer-level lens molding; wafer-level packaging; wafer-level processing; wafer-to-wafer permanent bonding; Bonding; CMOS integrated circuits; Cameras; Coatings; Lenses; Sensors; BSI; CIS module; wafer-level camera; wafer-level optics; wafer-level processing and integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-1770-3
Electronic_ISBN :
978-1-4577-1768-0
Type :
conf
DOI :
10.1109/ICEPT.2011.6067039
Filename :
6067039
Link To Document :
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