Signal processing for detectors: selected topics

Simulation tools and the designers´ expertise in advanced monolithic circuits have achieved a high level of success in accurately predicting the behavior of analog and digital designs, as will be demonstrated by several very sophisticated and successful ASIC projects that will be presented at this conference. The goal of this presentation is to review and clarify some critical circuit and detector related issues in an attempt to aid the designers in exploiting the advantages of new technologies, and in optimizing the performance of detector systems. The following topics will be discussed: 1) Signals and signal return in multielement (pixel and pad) detectors; 2) Induced gate noise: Is it significant in detector preamplifiers? 3) Noise from dielectrics in detector amplifier connections 4) Second stage noise in monolithic amplifiers 5) kTC noise and its transient behavior in switched and sampled circuits 6) Correlated and uncorrelated sampling, and baseline restoration 7) Dynamic range and precision vs technology 8) Supplying power to monolithics in large detector systems.