A new free-wave dielectric and magnetic properties measurement system at millimetre wavelengths

Author

Khosrowbeygi, A. ; Griffiths, H.D. ; Cullen, A.L.

Author_Institution

Dept. of Electron. & Electr. Eng., Univ. Coll. London, UK

fYear

1994

fDate

23-27 May 1994

Firstpage

1461

Abstract

A new free-wave method for measuring complex permittivity and permeability of materials at mm-wave frequencies is introduced. The use of time gating for removing the unwanted reflections within the sample, and its advantages in simplifying the calculations and decreasing the dependence of measurement accuracy on frequency are discussed. The error due to imperfect gate parameters is derived by simulation, and the optimum sample thickness is recommended. Examples of results obtained from measurements of ferrite and dielectric samples are presented and discussed.<>

Keywords

dielectric materials; magnetic permeability measurement; microwave measurement; permittivity measurement; simulation; complex permeability; complex permittivity; dielectric samples; ferrite; free-wave dielectric measurement system; free-wave method; imperfect gate parameters; magnetic properties measurement system; millimetre wavelengths; mm-wave frequencies; optimum sample thickness; simulation; time gating; unwanted reflections; Dielectric materials; Dielectric measurements; Ferrites; Frequency measurement; Magnetic materials; Magnetic properties; Permeability measurement; Permittivity measurement; Reflection; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1994., IEEE MTT-S International

Conference_Location

San Diego, CA, USA

ISSN

0149-645X

Print_ISBN

0-7803-1778-5

Type

conf

DOI

10.1109/MWSYM.1994.335136

Filename

335136