DocumentCode
2190321
Title
A silicon carbide self-aligned and ion implanted static induction transistor (SAI-SIT) for 150 watt S-Band operation
Author
Knight, T.J. ; Clarke, R.C. ; Barron, R.R. ; Ostop, J.A. ; Morick, B.A. ; Gigante, J.R. ; Malkowski, W.J. ; Morse, A.W. ; DeSalvo, G.C. ; Petrosky, K.J. ; Curtice, W.R.
Author_Institution
Northrop Grumman Corp, Baltimore, MD, USA
fYear
2002
fDate
24-26 June 2002
Firstpage
179
Lastpage
180
Abstract
The Static Induction Transistor (SIT) has proven itself as an appropriate device to take full advantage of the high breakdown field strength, thermal conductivity, and electron velocity characteristics of silicon carbide. Microwave SITs using metal Schottky gates have been fabricated by several groups. For example, L-Band Schottky SITs with over 900 W of output power and 60% efficiency have been demonstrated. However, in order to achieve power gain at 3.0 GHz, more stringent geometric and alignment tolerances are required. At the same time, reaching 150 Watts at S-Band requires that the tight dimensional constraints be maintained across the expanse of large devices. A novel type of Static Induction Transistor fabricated in 4H-silicon carbide, described here for the first time, relies on self-aligned oxide isolation spacers between the source and an implanted gate.
Keywords
ion implantation; microwave field effect transistors; microwave power transistors; power field effect transistors; silicon compounds; static induction transistors; wide band gap semiconductors; 150 W; 3.0 GHz; 4H-silicon carbide static induction transistor; S-band operation; SAI-SIT; SiC; ion implantation; metal Schottky gate; microwave SIT; power gain; self-aligned oxide isolation spacer; Contracts; Fingers; Microwave transistors; Nickel; Power transistors; Scanning electron microscopy; Silicides; Silicon carbide; Thermal conductivity; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 2002. 60th DRC. Conference Digest
Conference_Location
Santa Barbara, CA, USA
Print_ISBN
0-7803-7317-0
Type
conf
DOI
10.1109/DRC.2002.1029586
Filename
1029586
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