• DocumentCode
    2190590
  • Title

    Photographic study of discharge development and high-current arc modes in vacuum

  • Author

    Janiszewski, J. ; Zalucki, Z.

  • Author_Institution
    Inst. of Electric Power Eng., Poznan Tech. Univ., Poland
  • Volume
    1
  • fYear
    1996
  • fDate
    21-26 Jul 1996
  • Firstpage
    220
  • Abstract
    Photographic studies of discharge development and arc modes were done for high-current arcs between cup (contrate) contacts at a fixed contact gap (10 mm). The peak value of the applied AC arc current half-wave ranged from a few kA to 24 kA. Photographs of the arc were taken with a high-speed framing camera at 10000 frames/s. Three main arc modes are distinguished: diffuse; diffuse with local discharge concentrations near the electrode, and constricted with a stationary anode spot. The authors showed a tendency of the anode spot to locate inside the cup. This effect is typical for various sorts of contacts with cup. The authors stressed the harmful influence of the constricted arc with a stationary anode spot in the bottom of the cup on current interrupting and magnetic fields generation by the contrate contact
  • Keywords
    electric breakdown; electrical contacts; insulation testing; photography; vacuum arcs; vacuum breakdown; vacuum insulation; AC arc current half-wave; constricted arc; contact gap; contrate contact; current interrupting; diffuse arc; high-current arc modes; insulation breakdown testing; local discharge concentrations; magnetic field generation; photographic studies; stationary anode spot; vacuum discharge development; Anodes; Cameras; Electrodes; Fault location; Magnetic fields; Plasma properties; Plasma sources; Power engineering and energy; Vacuum arcs; Vacuum technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 1996. Proceedings. ISDEIV., XVIIth International Symposium on
  • Conference_Location
    Berkeley, CA
  • Print_ISBN
    0-7803-2906-6
  • Type

    conf

  • DOI
    10.1109/DEIV.1996.545354
  • Filename
    545354