DocumentCode :
2190980
Title :
An empirical model to estimate the microwave penetration depth of frozen soil
Author :
Shaojie Zhao ; Lixin Zhang ; Tao Zhang ; Zhenguo Hao ; Linna Chai ; Zhongjun Zhang
Author_Institution :
State Key Lab. of Remote Sensing Sci., Beijing Normal Univ., Beijing, China
fYear :
2012
fDate :
22-27 July 2012
Firstpage :
4493
Lastpage :
4496
Abstract :
The technique of microwave remote sensing has been used to monitor the soil frozen/thawed status for many years. The dielectric constant of frozen soil is relatively lower than that of unfrozen soil, so that microwave could penetrate deeper into frozen soil. However, we are still lack of the knowledge of the Microwave Penetration Depth (MPD) of frozen soil. In this study, a noncoherent microwave radiation was used to find the factors that influence the MPD of frozen soil and then validated by experiments. The results showed that the frequency of microwave, the temperature of frozen soil and the soil texture are the main factors that determine the MPD of frozen soil. An empirical model that estimates the MPD of frozen soil was proposed based on the simulation data.
Keywords :
geophysical techniques; microwave measurement; permittivity; remote sensing; soil; terrestrial electricity; terrestrial heat; texture; empirical model; frozen soil dielectric constant; frozen soil temperature; microwave frequency; microwave penetration depth estimation; microwave remote sensing; noncoherent microwave radiation; soil texture; unfrozen soil; Aluminum; Microwave measurements; Microwave radiometry; Microwave theory and techniques; Soil; Soil measurements; Temperature measurement; Microwave remote sensing; frozen soil; microwave radiation; penetration depth;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
Conference_Location :
Munich
ISSN :
2153-6996
Print_ISBN :
978-1-4673-1160-1
Electronic_ISBN :
2153-6996
Type :
conf
DOI :
10.1109/IGARSS.2012.6350473
Filename :
6350473
Link To Document :
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