Title :
Power analysis techniques for SoC with improved wiring models
Author :
Sakamoto, Takeshi ; Yamada, Takashi ; Mukuno, Mamoru ; Matsushita, Yoshifumi ; Harada, Yasoo ; Yasuura, Hiroto
Author_Institution :
Sanyo Electr. Co. Ltd., Gifu, Japan
Abstract :
This paper proposes two techniques for improving the accuracy of gate-level power analysis for system-on-a-chip (SoC). (1) The creation of custom wire load models for clock nets; and (2) the use of layout information (actual net capacitance and input signal transition time). The analysis time is reduced to less than one three-hundredth of the transistor-level power analysis time. The error is within 5% of that of a real chip, (the same level in transistor-level power analysis) if technique (2) is used. The analytical error between technique (1) and (2) is within 1%.
Keywords :
VLSI; capacitance; integrated circuit layout; integrated circuit modelling; low-power electronics; network routing; system-on-chip; SoC; analysis time reduction; clock nets; custom wire load models; gate-level power analysis; input signal transition time; layout information; net capacitance; power analysis techniques; system-on-a-chip; Capacitance; Clocks; Error analysis; Information analysis; Load modeling; Power system modeling; Signal analysis; System-on-a-chip; Wire; Wiring;
Conference_Titel :
Low Power Electronics and Design, 2002. ISLPED '02. Proceedings of the 2002 International Symposium on
Print_ISBN :
1-5811-3475-4
DOI :
10.1109/LPE.2002.146750