• DocumentCode
    2191033
  • Title

    Behavioural modeling and simulation of a switched-current phase locked loop

  • Author

    Wilson, Peter ; Wilcock, Reuben ; Al-Hashimi, Bashir ; Brown, Andrew D.

  • Author_Institution
    Sch. of Electron. & Comput. Sci., Southampton Univ., UK
  • fYear
    2005
  • fDate
    22-23 Sept. 2005
  • Firstpage
    31
  • Lastpage
    36
  • Abstract
    In this paper we describe the design approach of a phase locked loop (PLL) based on a novel switched-current (SI) architecture using behavioural models written in MAST. Simulations demonstrate the performance of the design at a high level and are used to optimize the behaviour of the loop response with regard to design specifications. The modeling approach is explained, from the basic building blocks used in the SI methodology through to more abstract models of the system architecture. The advantage of using behavioural models is highlighted with the ability to carry out parametric analysis and statistical analysis to investigate tolerances, adherence to specifications and parameter variations. The resulting simulations are consistent with transistor level simulation results, but several orders of magnitude faster. The resulting design achieves a performance that is comparable with designs using current techniques but with significantly reduced area.
  • Keywords
    CMOS digital integrated circuits; circuit optimisation; circuit simulation; high level synthesis; phase locked loops; switched current circuits; MAST; behavioural modeling; design specification; parametric analysis; statistical analysis; switched-current phase locked loop simulation; Analog integrated circuits; CMOS analog integrated circuits; CMOS digital integrated circuits; Capacitors; Circuit simulation; Circuit topology; Computational modeling; Integrated circuit modeling; Phase locked loops; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Behavioral Modeling and Simulation Workshop, 2005. BMAS 2005. Proceedings of the 2005 IEEE International
  • Print_ISBN
    0-7803-9352-X
  • Type

    conf

  • DOI
    10.1109/BMAS.2005.1518183
  • Filename
    1518183