• DocumentCode
    2191558
  • Title

    The statistical and formative times for breakdown at a polymer-oil interface

  • Author

    Wilson, Mark P. ; Given, Martin J. ; Timoshkin, Igor V. ; Macgregor, S.J. ; Wang, Tao ; Sinclair, Mark A. ; Thomas, Ken J. ; Lehr, Jane M.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. of Strathclyde, Glasgow, UK
  • fYear
    2012
  • fDate
    3-7 June 2012
  • Firstpage
    43
  • Lastpage
    46
  • Abstract
    The average statistical time and formative time associated with breakdown across a polymer-oil interface have been extracted from experimental time-to-breakdown data, gathered using a non-uniform electrode geometry designed to promote surface discharges. Five polymer materials of relevance to the designers of pulsed-power systems have been considered: polypropylene; LDPE; UHMWPE; Rexolite; and Torlon. It has been assumed that the temporal distribution of breakdowns can be described using the approach developed by von Laue, and the validity of this approach is discussed within the paper. The materials were clearly separated in terms of the statistical component of the overall time to breakdown, with Torlon showing the shortest average statistical time (~17 ns), and Rexolite the longest (~54 ns). However, the derived formative times were shorter for Torlon and Rexolite than for the other materials; PP, LDPE, and UHMWPE have similar formative times, at ~350-400 ns.
  • Keywords
    oils; polyethylene insulation; pulsed power supplies; statistical analysis; surface discharges; LDPE; Torlon; UHMWPE; formative time; nonuniform electrode geometry design; polymer material; polymer-oil interface; polypropylene; pulsed power system; rexolite; statistical component; statistical time; surface discharge; temporal breakdown distribution; time-to-breakdown data; Dielectric breakdown; flashover; pulsed power supplies; statistical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Modulator and High Voltage Conference (IPMHVC), 2012 IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4673-1222-6
  • Type

    conf

  • DOI
    10.1109/IPMHVC.2012.6518675
  • Filename
    6518675