Title :
A framework for evaluating the performance of bipolar power transistor drive circuits
Author :
Ellis, Julie ; Burns, William
Author_Institution :
Digital Equipment Corporation, Marlboro, Massachusetts, 01752
Abstract :
A structured method for evaluating bipolar power transistor base drive circuitry is presented. Techniques used to generate the data required for the evaluation are also presented. Experimental measurements, theoretical analyses and computer simulations, which include parasitic elements and the effects of component variations, are the basis for the evaluation. Two examples illustrate the structured method of evaluating and comparing base drive circuits.
Keywords :
Circuit optimization; Ice; Integrated circuit reliability; Power supplies; Power transistors; Switching circuits; Transistors;
Conference_Titel :
Power Electronics Specialists Conference, 1983 IEEE
Conference_Location :
Albuquerque, New Mexico, USA
DOI :
10.1109/PESC.1983.7069872
