Title :
Power constrained preemptive TAM scheduling
Author :
Larsson, Erik ; Fujiwara, Hideo
Author_Institution :
Graduate Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan
Abstract :
We integrate scan-chain partitioning and preemptive test access mechanism (TAM) scheduling for core-based systems under power constraint. We also outline a flexible power conscious test wrapper to increase the flexibility in the scheduling process by (1) allowing several different bandwidths at cores and (2) controlling the cores test power consumption, which makes it possible to increase the test clock. We model the scheduling problem as a bin-packing problem and discuss the transformations: (1) TAM-time and (2) power-time and the possibilities of achieving an optimal solution and the limitations. We have implemented our proposed preemptive TAM scheduling algorithm and through experiments we demonstrate its efficiency.
Keywords :
VLSI; bin packing; built-in self test; integrated circuit testing; logic testing; scheduling; system-on-chip; bin-packing problem; core-based systems; flexible power conscious test wrapper; power constrained preemptive TAM scheduling; preemptive test access mechanism scheduling; scan-chain partitioning; test clock; test power consumption; Automatic testing; Bandwidth; Built-in self-test; Circuit testing; Clocks; Control systems; Information science; Power system modeling; Scheduling; System testing;
Conference_Titel :
Test Workshop, 2002. Proceedings. The Seventh IEEE European
Print_ISBN :
0-7695-1715-3
DOI :
10.1109/ETW.2002.1029648