Title :
Comparison of key performance metrics in two- and three-dimensional integrated circuits
Author :
Rahman, Arifur ; Fan, Andy ; Reif, Rafael
Author_Institution :
Microsystems Technol. Lab., MIT, Cambridge, MA, USA
Abstract :
In this paper some key performance metrics in two-dimensional (2-D) and three-dimensional (3-D) integrated circuits (IC) are estimated for scaled technologies from 250-nm to 50-nm technology nodes using a system-level modeling approach. Considering a microprocessor as an example, projections are made for performance metrics such as clock frequency, chip area, interconnect delay and repeater´s number for 2-D and 3-D implementation
Keywords :
integrated circuit modelling; microprocessor chips; 50 to 250 nm; chip area; clock frequency; interconnect delay; microprocessor; performance metric; repeater number; system-level model; three-dimensional integrated circuit; two-dimensional integrated circuit; Clocks; Delay; Frequency; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit technology; Measurement; Microprocessors; Repeaters; Two dimensional displays;
Conference_Titel :
Interconnect Technology Conference, 2000. Proceedings of the IEEE 2000 International
Conference_Location :
Burlingame, CA
Print_ISBN :
0-7803-6327-2
DOI :
10.1109/IITC.2000.854268
