Title :
A new hollow-cathode magnetron source for 0.10 μm copper applications
Author :
Ashtiani, K.A. ; Klawuhn, E. ; Hayden, D. ; Ow, M. ; Levy, K.B. ; Danek, M.
Author_Institution :
Novellus Syst. Inc., San Jose, CA, USA
Abstract :
A new design Hollow-Cathode Magnetron (HCM) source was evaluated for 0.10 μm copper (Cu) seed deposition applications. The new source included: (i) an external Dual Coil electromagnet for plasma confinement and metal ion flux control, and (ii) an optimized DC magnetron for high plasma density operation and improved target erosion. With the modified source, highly uniform deposition of copper seed(~2%, 1σ) was achieved on 200 mm wafers minimizing the center-to-edge variability in subsequent electrochemical copper fill (electrofill). In addition, the high plasma density operation significantly improved conformality of the seed deposition allowing reduction of the seed field thickness from 1500 Å to ~800 Å while achieving void free electrofill of 0.10-0.13 μm test structures
Keywords :
copper; electroplating; integrated circuit interconnections; integrated circuit metallisation; plasma density; sputter deposition; 0.10 mum; 200 mm; Cu; Cu seed deposition applications; center-to-edge variability; external Dual Coil electromagnet; high plasma density operation; hollow-cathode magnetron source; improved target erosion; metal ion flux control; plasma confinement; Atherosclerosis; Coils; Copper; Electromagnets; Magnetic confinement; Magnetic flux; Microprocessors; Plasma density; Plasma temperature; Testing;
Conference_Titel :
Interconnect Technology Conference, 2000. Proceedings of the IEEE 2000 International
Conference_Location :
Burlingame, CA
Print_ISBN :
0-7803-6327-2
DOI :
10.1109/IITC.2000.854274
