Title :
Sensitivity analysis of the millimeter-wave heat performance parameters f/sub T/ and f/sub max/ to errors in the equivalent circuit elements
Author_Institution :
Lab. for Electromagn. Feilds & Microwave Electron., Eidgenossische Tech. Hochschule, Zurich, Switzerland
Abstract :
For MM-wave FETs, the performance parameters f/sub T/ (transition frequency) and f/sub max/ (max. oscillation frequency) are usually calculated from inexactly known equivalent circuit models. The consequences of errors in the model on f/sub T/ and f/sub max/ art evaluated through a sensitivity analysis of the complete equivalent circuit. This analysis shows quantitatively how f/sub T/ and f/sub max/ depend differently on element errors in the model, and that f/sub max/ is especially susceptible to errors in R/sub G/, R/sub i/ and R/sub D/.<>
Keywords :
equivalent circuits; errors; high electron mobility transistors; semiconductor device models; sensitivity analysis; solid-state microwave devices; MM-wave FETs; equivalent circuit elements; errors; heat performance parameters; millimeter-wave FET; sensitivity analysis; Art; Circuit analysis; Equivalent circuits; FETs; Frequency; Millimeter wave circuits; Sensitivity analysis;
Conference_Titel :
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-1778-5
DOI :
10.1109/MWSYM.1994.335222