Title :
On expressions for line form and natural linewidth in semiconductor lasers
Author :
Kovalevski, Artyom P. ; Noppe, Michael G.
Author_Institution :
Dept. of Appl. Math., Novosibirsk State Tech. Univ., Novosibirsk, Russia
Abstract :
New expressions for laser mode line form and effective natural linewidth in semiconductor lasers are derived. New linewidth formula is presented in dimensionless values and is functionally different from Schawlow-Townes formula. The line form differs from the Lorentz profile the more frequency nonlinearity parameter is larger. The estimation made allows explaining the influence of amplitude fluctuations in semiconductor lasers by small value of length of lasers. The basic concepts of our approach: using laser model distributed in space; using an experimental formula for laser frequency, depending on the laser amplitude; using a special model of the spectral theory of stochastic processes. The formula derived allows now explaining some experimental measurements of the linewidth: effective natural linewidth does not tend to zero with the increase in laser amplitude.
Keywords :
fluctuations; laser beams; laser modes; semiconductor lasers; spectral line breadth; stochastic processes; amplitude fluctuations; effective natural linewidth; laser amplitude; laser frequency; laser mode line form; semiconductor lasers; stochastic processes; Electric variables measurement; Fluctuations; Frequency; Laser modes; Laser theory; Power lasers; Power measurement; Semiconductor lasers; Stochastic processes; Virtual manufacturing; Line form; lasers; linewidth; semiconductor;
Conference_Titel :
Electrical and Electronics Engineers in Israel, 2008. IEEEI 2008. IEEE 25th Convention of
Conference_Location :
Eilat
Print_ISBN :
978-1-4244-2481-8
Electronic_ISBN :
978-1-4244-2482-5
DOI :
10.1109/EEEI.2008.4736696
