DocumentCode
2192981
Title
The effects of substrate resistivity on RF component and circuit performance
Author
Floyd, Brian A. ; Hung, Chih-Ming ; O, Kenneth K.
Author_Institution
Silicon Microwave Integrated Circuits & Syst. Res. Group, Florida Univ., Gainesville, FL, USA
fYear
2000
fDate
2000
Firstpage
164
Lastpage
166
Abstract
The benefits of using high-resistivity substrates for RF CMOS applications are experimentally quantified. The quality factors of spiral inductors with a patterned ground shield, varactors, and transistors have been measured on both p+ (with epi) and p - substrates, and in each case, Q is higher on p$substrates. A 5.35-GHz VCO on a p-substrate has an 8 dB lower phase noise than that on a p+ substrate, while a 7-GHz LNA on a p- substrate has a 6 dB higher gain and ~2.5 dB lower noise figure than that on a p+ substrate
Keywords
CMOS analogue integrated circuits; Q-factor; inductors; radiofrequency amplifiers; radiofrequency oscillators; varactors; voltage-controlled oscillators; 5.35 GHz; 7 GHz; CMOS circuit; RF component; gain; low noise amplifier; noise figure; patterned ground shield; phase noise; quality factor; spiral inductor; substrate resistivity; transistor; varactor; voltage controlled oscillator; Circuits; Conductivity; Inductors; Phase noise; Q factor; Q measurement; Radio frequency; Spirals; Varactors; Voltage-controlled oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Interconnect Technology Conference, 2000. Proceedings of the IEEE 2000 International
Conference_Location
Burlingame, CA
Print_ISBN
0-7803-6327-2
Type
conf
DOI
10.1109/IITC.2000.854313
Filename
854313
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