DocumentCode :
2193136
Title :
Quasi-simultaneous external electrooptic probing of transverse and longitudinal field distributions taking into account the probe tip invasiveness
Author :
Thomann, W. ; Russer, P.
Author_Institution :
Inst. fur Hochfrequenztech., Tech. Univ. Munchen, Germany
fYear :
1994
fDate :
23-27 May 1994
Firstpage :
1601
Abstract :
A versatile electrooptic measurement setup facilitates the direct probing of circuits on electrooptic substrates and on arbitrary substrates by employing an external probe tip of a specific crystal-cut that allows the quasi-simultaneous probing of transverse and quasi-longitudinal electric field components. Employing the presented quasi-simultaneous measurements and the theoretical methods, the determined change in intensity of the transmitted laser beam can be used for the implementation of correction algorithms in the space-domain and time-domain. As examples we use microstrip lines and coupled microstrip transmission lines.<>
Keywords :
electric field measurement; electro-optical effects; measurement by laser beam; microstrip lines; microwave measurement; probes; circuits; correction algorithms; coupled microstrip transmission lines; crystal-cut; electric field; electrooptic substrates; external electrooptic probing; laser beam; longitudinal field distributions; microstrip lines; probe tip invasiveness; quasi-simultaneous measurements; space-domain; time-domain; transverse field distributions; Circuits; Electric variables measurement; Laser beams; Laser theory; Laser transitions; Lasers and electrooptics; Microstrip; Probes; Time domain analysis; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location :
San Diego, CA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-1778-5
Type :
conf
DOI :
10.1109/MWSYM.1994.335267
Filename :
335267
Link To Document :
بازگشت