Title :
Accurate error correction technique for on-chip lightwave measurements of optoelectronic devices
Author :
Debie, P. ; Martens, L.
Author_Institution :
Dept. of Inf. Technol., Ghent Univ., Belgium
Abstract :
A new and accurate error correction technique for on-chip modulation response measurements of high-frequency optoelectronic devices is presented. Mathematical expressions for the different sources of errors that exist in the measurement system are derived. The new correction technique applied to the modulation response measurement of a strained quantum well laser diode shows excellent agreement with the theoretically expected result.<>
Keywords :
error analysis; error correction; laser variables measurement; measurement errors; optical modulation; semiconductor lasers; error correction; high-frequency optoelectronic devices; measurement system; modulation response; on-chip lightwave measurements; strained quantum well laser diode; Diode lasers; Error correction; Optoelectronic devices; Quantum mechanics;
Conference_Titel :
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-1778-5
DOI :
10.1109/MWSYM.1994.335270
