DocumentCode
2193194
Title
Accurate error correction technique for on-chip lightwave measurements of optoelectronic devices
Author
Debie, P. ; Martens, L.
Author_Institution
Dept. of Inf. Technol., Ghent Univ., Belgium
fYear
1994
fDate
23-27 May 1994
Firstpage
1589
Abstract
A new and accurate error correction technique for on-chip modulation response measurements of high-frequency optoelectronic devices is presented. Mathematical expressions for the different sources of errors that exist in the measurement system are derived. The new correction technique applied to the modulation response measurement of a strained quantum well laser diode shows excellent agreement with the theoretically expected result.<>
Keywords
error analysis; error correction; laser variables measurement; measurement errors; optical modulation; semiconductor lasers; error correction; high-frequency optoelectronic devices; measurement system; modulation response; on-chip lightwave measurements; strained quantum well laser diode; Diode lasers; Error correction; Optoelectronic devices; Quantum mechanics;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location
San Diego, CA, USA
ISSN
0149-645X
Print_ISBN
0-7803-1778-5
Type
conf
DOI
10.1109/MWSYM.1994.335270
Filename
335270
Link To Document