DocumentCode :
2193280
Title :
Fast opening switch approach for high-voltage vacuum tube protection application
Author :
Merz, W. ; Grimes, Mark
Author_Institution :
DESY, Hamburg, Germany
fYear :
2012
fDate :
3-7 June 2012
Firstpage :
308
Lastpage :
311
Abstract :
The operation of high-power, high-frequency vacuum tubes requires an appropriate protection method to avoid significant damages during arcing. Fast closing switches like spark gaps, thyratrons, ignitrons and semiconductors acting as charge-diverting bypass switches are the most commonly used protection method. These “crowbar” switches cause hard transient conditions for all subcomponents involved and usually result in a significant post-fault recovery period. The availability of fast high-voltage semiconductor devices, with flexible on/off control function, makes opening switch topologies possible and attractive to improve this situation. This paper describes a circuit topology to protect an Inductive Output Tube which is expected to operate within RF subsystems for accelerator applications. The topology is characterized by using a commercial available high voltage MOSFET switch with direct liquid cooling and completed with essential snubber extensions. The advantages of the opening switch approach are faster action, smaller fault energy, faster recovery, and more compact design. Initial test results of this topology are presented.
Keywords :
circuit-breaking arcs; cooling; field effect transistor switches; particle accelerators; power semiconductor switches; snubbers; switchgear protection; vacuum tubes; RF subsystems; accelerator applications; arcing; charge-diverting bypass switches; circuit topology; crowbar switches; direct liquid cooling; fast closing switches; fast high-voltage semiconductor device availability; fast opening switch approach; fault energy; flexible on/off control function; hard transient conditions; high voltage MOSFET switch; high-power high-frequency vacuum tubes; high-voltage vacuum tube protection application; inductive output tube protection; opening switch topologies; post-fault recovery period; snubber extensions; opening; semiconductor; switch; tube protection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Modulator and High Voltage Conference (IPMHVC), 2012 IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-1222-6
Type :
conf
DOI :
10.1109/IPMHVC.2012.6518741
Filename :
6518741
Link To Document :
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