• DocumentCode
    2193302
  • Title

    The effect of electron beam irradiation on insulating characteristics of molding compound for power semiconductor modules

  • Author

    Hong, Nung-Pyo ; Lee, Yong-Woo ; Im, Pil-Gyu ; Cho, Don-Chan ; Hong, Jin-woong

  • Author_Institution
    Power Electron. Team, Samsung Electron. Ltd., Buchan, South Korea
  • fYear
    1996
  • fDate
    20-23 May 1996
  • Firstpage
    207
  • Lastpage
    210
  • Abstract
    The high temperature-low expansion type epoxy resin used for molding material of power semiconductor elements is irradiated with an electron beam. It is found that the insulating characteristics of the molding material varied with electron beam irradiation conditions. The insulating characteristics of the molding material, such as dielectric breakdown voltage and volume resistivity, are investigated as a function of electron beam dose. As a result, the specimen which is irradiated with 4 Mrad has exhibited a high breakdown voltage and volume resistivity
  • Keywords
    electric breakdown; electrical conductivity; electron beam effects; epoxy insulation; modules; power semiconductor devices; semiconductor device packaging; 4 Mrad; dielectric breakdown voltage; electron beam dose; electron beam irradiation; epoxy resin; insulating characteristics; molding compound; power semiconductor modules; volume resistivity; Breakdown voltage; Conductivity; Dielectric breakdown; Dielectric materials; Electron beams; Insulation; Packaging; Polymers; Semiconductor materials; Volume measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1996. ISPSD '96 Proceedings., 8th International Symposium on
  • Conference_Location
    Maui, HI
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-3106-0
  • Type

    conf

  • DOI
    10.1109/ISPSD.1996.509482
  • Filename
    509482