Title :
Current signatures for production testing [CMOS ICs]
Author :
Gattiker, A. ; Nigh, P. ; Grosch, D. ; Maly, W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
The concept of the current signature has been proposed as a means for improving testing resolution over single-threshold Iddq testing. This paper postulates a practical methodology for applying the current signature concept for die selection in a production environment.
Keywords :
CMOS integrated circuits; electric current measurement; integrated circuit testing; leakage currents; production testing; CMOS ICs; current signature; die selection; production environment; production testing; single-threshold Iddq testing; testing resolution; Circuit faults; Current measurement; Microelectronics; Performance evaluation; Production; Sorting; Testing; Voltage;
Conference_Titel :
IDDQ Testing, 1996., IEEE International Workshop on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-8186-7655-8
DOI :
10.1109/IDDQ.1996.557804
