Title :
The YATE fail-safe interface: the user´s point of view
Author :
Bied-Charreton, D. ; Guillon, D. ; Jacques, B.
Author_Institution :
INRETS, Arcueil, France
Abstract :
This paper deals with some aspects of the use of self-checking integrated circuits in an application that manages the major risks involved in a transport system. It aims to provide an objective account of the advantages and disadvantages of this type of technology. Attention has been focused on the demands made by such integrated circuits on their environment, in particular the CPUs which control them. Nevertheless, much work still needs to be done to bring the design and testing of integrated circuits more in line with the needs of rail safety applications.
Keywords :
built-in self test; integrated circuit testing; railways; redundancy; safety systems; signalling; CPUs; YATE fail-safe interface; rail safety applications; railway signalling; self-checking integrated circuits; testing; transport system; Circuit testing; Clocks; Computer displays; Frequency; Light emitting diodes; Lighting control; Radio control; Rails; Signal design; Signal processing;
Conference_Titel :
Memory Technology, Design and Testing, 2002. (MTDT 2002). Proceedings of the 2002 IEEE International Workshop on
Print_ISBN :
0-7695-1617-3
DOI :
10.1109/MTDT.2002.1029761