DocumentCode :
2194751
Title :
Effect of particle size distribution on the performance of electrodynamic screens
Author :
Johnson, C.E. ; Srirama, P.K. ; Sharma, R. ; Pruessner, K. ; Zhang, J. ; Mazumder, M.K.
Author_Institution :
Dept. of Appl. Sci., Arkansas Univ., Little Rock, AR, USA
Volume :
1
fYear :
2005
fDate :
2-6 Oct. 2005
Firstpage :
341
Abstract :
Electrodynamic screens (EDS) consist of rows of parallel electrodes deposited on a dielectric substrate covered by a thin insulating coating. The EDS electrodes are connected to a single or multi-phase AC high voltage source to generate an alternating electric field between the electrodes. Such screens have been shown to remove accumulated dust when an alternating voltage is applied. The effect of dust particle size distribution (PSD) on the dust removal efficiency (DRE) of the EDS was analyzed for its application to lunar and Mars missions. Samples of JSC Mars-1 dust simulant were classified into two different particle size distributions. The PSD difference was measured using an electronic single particle relaxation time (ESPART) analyzer. The classified powder was then used to test the performance of electrodynamic screens with two different electrode geometries. The DRE for powder with a count median diameter (CMD) of 5.8 μm was 77.3%, where as for a CMD of 5.2 μm the DRE was 47.1%.
Keywords :
Mars; electric fields; electrodes; electrodynamics; insulating coatings; particle size; particle size measurement; planetary atmospheres; substrates; AC high voltage source; Mars-1 dust simulant; alternating electric field; dielectric substrate deposition; dust abatement; dust removal efficiency; electrodynamic screen; electronic single particle relaxation time analyzer; lunar; parallel electrode; particle size distribution; thin insulating coating; AC generators; Coatings; Dielectric substrates; Dielectrics and electrical insulation; Electric fields; Electrodes; Electrodynamics; Moon; Powders; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2005. Fourtieth IAS Annual Meeting. Conference Record of the 2005
ISSN :
0197-2618
Print_ISBN :
0-7803-9208-6
Type :
conf
DOI :
10.1109/IAS.2005.1518330
Filename :
1518330
Link To Document :
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