Title :
Characterization of normally-off SiC vertical JFET devices and inverter circuits
Author :
Lai, J.-S. ; Yu, H. ; Zhang, J. ; Alexandrov, P. ; Li, Y. ; Zhao, J.H. ; Sheng, K. ; Hefner, A.
Author_Institution :
Future Energy Electron. Center, Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
A latest developed normally-off SiC JFETs has been characterized under static and dynamic operating conditions. Two application oriented inverter circuits were constructed for additional tests under and soft- and hard-switching conditions. The single-phase soft-switching inverter was running at 100 kHz, and the three-phase hard-switching inverter was running at 15 kHz. The unique feature of the inverter operating in synchronous rectification mode has been observed. Without synchronous rectification, the freewheeling diode voltage drop is a fixed voltage plus a resistive voltage. The fixed voltage at zero current is about 1 V for the tested SiC Schottky diodes, and the resistive voltage drop portion is highly dependent on the temperature. With synchronous rectification, the voltage drop is the product of the on-drop resistance and the drain current of the JFET, which can be controlled with the chip area. In the experimental case, the measured voltage drop was 1 V with JFET conducting in reverse direction and 2 V with diode forward conducting. Thus the new generation SiC VJFET device allows high-efficiency inverter operation with reduction of the conduction loss by synchronous rectification and the reduction of switching loss with soft switching.
Keywords :
Schottky diodes; invertors; junction gate field effect transistors; rectification; silicon compounds; voltage control; voltage measurement; wide band gap semiconductors; 1 V; 1 kHz; 10 kW; 100 kHz; JFET device characterization; SiC; SiC Schottky diode; VJFET device; dynamic operating condition; freewheeling diode; hard-switching condition; inverter circuit; soft-switching condition; static operating condition; switching loss; synchronous rectification mode; voltage drop control; voltage drop measurement; Circuit testing; Electrical resistance measurement; Inverters; JFET circuits; Schottky diodes; Semiconductor device measurement; Silicon carbide; Temperature dependence; Voltage control; Voltage measurement;
Conference_Titel :
Industry Applications Conference, 2005. Fourtieth IAS Annual Meeting. Conference Record of the 2005
Print_ISBN :
0-7803-9208-6
DOI :
10.1109/IAS.2005.1518340