• DocumentCode
    2194983
  • Title

    Performance under Failures of MapReduce Applications

  • Author

    Jin, Hui ; Qiao, Kan ; Sun, Xian-He ; Li, Ying

  • Author_Institution
    Dept. of Comput. Sci., Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    2011
  • fDate
    23-26 May 2011
  • Firstpage
    608
  • Lastpage
    609
  • Abstract
    The MapReduce programming paradigm is gaining more and more popularity in recent years due to its ability in supporting easy programming, data distribution, as well as fault tolerance. Failure is an unwanted but inevitable fact that all large-scale parallel computing systems have to face with. MapReduce introduces a novel data replication and task reexecution strategy for fault tolerance. This study intends to lead a better understanding of such fault tolerance mechanisms. In particular, we build a stochastic performance model to quantify the impact of failures on MapReduce applications and to investigate its effectiveness under different computing environments. Simulations also have been carried out to verify the accuracy of the proposed model. Our results show that data replication is an effective approach even when failure rate is high, and the task migration mechanism of MapReduce works well in balancing the reliability difference among individual nodes. This work provides a theoretical foundation for optimizing large-scale MapReduce applications, especially when fault tolerance is the concern.
  • Keywords
    fault tolerant computing; programming; MapReduce programming; data distribution; data replication; fault tolerance; large scale parallel computing system; task migration mechanism; Accuracy; Computational modeling; Data models; Fault tolerance; Fault tolerant systems; Programming; Fault Tolerance; MapReduce; Performance Model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Cluster, Cloud and Grid Computing (CCGrid), 2011 11th IEEE/ACM International Symposium on
  • Conference_Location
    Newport Beach, CA
  • Print_ISBN
    978-1-4577-0129-0
  • Electronic_ISBN
    978-0-7695-4395-6
  • Type

    conf

  • DOI
    10.1109/CCGrid.2011.84
  • Filename
    5948656