DocumentCode :
2195499
Title :
BXGrid: A Data Repository and Workflow Abstraction for Biometrics Research
Author :
Bui, Hoang ; Thomas, Deborah ; Kelly, Michael ; Lyon, Christopher ; Thain, Douglas ; Flynn, Patrick
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of Notre Dame, Notre Dame, IN
fYear :
2008
fDate :
7-12 Dec. 2008
Firstpage :
394
Lastpage :
395
Abstract :
Research in the field of biometrics depends on the effective management of large amounts of data and computation. Current research projects in biometrics acquire many terabytes of images and video of subjects in many different modes and situations, annotated with detailed metadata. To study the effectiveness of new algorithms for identifying people, researchers must exhaustively compare large numbers of measurements with a variety of custom functions. The quality of the end results is often dependent upon the sheer amount of data marshalled to support it.To address these challenges, we are constructing BXGrid, an end-to-end computing system for conducting biometrics research. BXGrid assists with the entire research process from data acquisition all the way to generating results for publication. Because the entire chain of research is kept consistently within one system, multiple users may easily share tools and results, building off of each other´s work. BXGrid also helps to ensure scientific integrity by automating a variety of consistency checks, external data audits, and reproduction of existing results.
Keywords :
biometrics (access control); data acquisition; grid computing; meta data; very large databases; BXGrid; biometrics research; consistency checks; data acquisition; data repository; end-to-end computing system; external data audits; metadata; scientific integrity; workflow abstraction; Biometrics; Computer science; Conference management; Data acquisition; Data engineering; Grid computing; Image color analysis; Image databases; Image storage; Portals;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
eScience, 2008. eScience '08. IEEE Fourth International Conference on
Conference_Location :
Indianapolis, IN
Print_ISBN :
978-1-4244-3380-3
Electronic_ISBN :
978-0-7695-3535-7
Type :
conf
DOI :
10.1109/eScience.2008.135
Filename :
4736813
Link To Document :
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