Testability design of multi-valued RTD circuits

Purpose of the paper is to analyze the physical faults and propose a testability design method for multi-valued RTD circuits based on the stuck faults analysis and stuck faults model, which takes ternary RTD (Resonant Tunneling Diode) quantizer as an example. The test model has a high testability level and low hardware cost which consists of an extra tri-valued inverter circuit and two control ports. By setting different input and testing signals, it generates different testing vectors, which can detect all open circuit faults and short circuit faults.