Testability design of multi-valued RTD circuits

Author

Mi, Lin ; Haipeng, Zhang ; Lingling, Sun

Author_Institution

Sch. of Electron. & Inf., Hangzhou Dianzi Univ., Hangzhou, China

fYear

2011

fDate

9-11 Sept. 2011

Firstpage

510

Lastpage

513

Abstract

Purpose of the paper is to analyze the physical faults and propose a testability design method for multi-valued RTD circuits based on the stuck faults analysis and stuck faults model, which takes ternary RTD (Resonant Tunneling Diode) quantizer as an example. The test model has a high testability level and low hardware cost which consists of an extra tri-valued inverter circuit and two control ports. By setting different input and testing signals, it generates different testing vectors, which can detect all open circuit faults and short circuit faults.

Keywords

fault diagnosis; logic testing; network synthesis; resonant tunnelling diodes; RTD quantizer; extra tri-valued inverter circuit; multivalued RTD circuits; open circuit faults; physical faults; resonant tunneling diode; short circuit faults; stuck faults analysis; stuck faults model; testability design; Circuit faults; HEMTs; Integrated circuit modeling; Resistance; Resonant tunneling devices; Testing; Vectors; RTD; multi-valued; open circuit fault; short circuit fault; testability design;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Communications and Control (ICECC), 2011 International Conference on

Conference_Location

Ningbo

Print_ISBN

978-1-4577-0320-1

Type

conf

DOI

10.1109/ICECC.2011.6067730

Filename

6067730