• DocumentCode
    2195999
  • Title

    An automatic optical inspection system for the diagnosis of printed circuits based on neural networks

  • Author

    Belbachir, Ahmed Nabil ; Lera, Mario ; Fanni, Alessandra ; Montisci, Augusto

  • Author_Institution
    Vienna Univ. of Technol., Austria
  • Volume
    1
  • fYear
    2005
  • fDate
    2-6 Oct. 2005
  • Firstpage
    680
  • Abstract
    The aim of this work is to define a procedure to develop diagnostic systems for printed circuit boards, based on automated optical inspection with low cost and easy adaptability to different features. A complete system to detect mounting defects in the circuits is presented in this paper. A low-cost image acquisition system with high accuracy has been designed to fit this application. Afterward, the resulting images are processed using the wavelet transform and neural networks, for low computational cost and acceptable precision. The wavelet space represents a compact support for efficient feature extraction with the localization property. The proposed solution is demonstrated on several defects in different kind of circuits.
  • Keywords
    automatic optical inspection; feature extraction; image recognition; neural nets; printed circuit design; printed circuit testing; wavelet transforms; automatic optical inspection system; cost reduction; feature extraction; image acquisition system; image processing; mounting defect detection; neural network; printed circuit board diagnosis; wavelet transform; Automatic optical inspection; Charge coupled devices; Charge-coupled image sensors; Contacts; Costs; Feature extraction; Neural networks; Pattern recognition; Printed circuits; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2005. Fourtieth IAS Annual Meeting. Conference Record of the 2005
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-9208-6
  • Type

    conf

  • DOI
    10.1109/IAS.2005.1518381
  • Filename
    1518381