DocumentCode
2195999
Title
An automatic optical inspection system for the diagnosis of printed circuits based on neural networks
Author
Belbachir, Ahmed Nabil ; Lera, Mario ; Fanni, Alessandra ; Montisci, Augusto
Author_Institution
Vienna Univ. of Technol., Austria
Volume
1
fYear
2005
fDate
2-6 Oct. 2005
Firstpage
680
Abstract
The aim of this work is to define a procedure to develop diagnostic systems for printed circuit boards, based on automated optical inspection with low cost and easy adaptability to different features. A complete system to detect mounting defects in the circuits is presented in this paper. A low-cost image acquisition system with high accuracy has been designed to fit this application. Afterward, the resulting images are processed using the wavelet transform and neural networks, for low computational cost and acceptable precision. The wavelet space represents a compact support for efficient feature extraction with the localization property. The proposed solution is demonstrated on several defects in different kind of circuits.
Keywords
automatic optical inspection; feature extraction; image recognition; neural nets; printed circuit design; printed circuit testing; wavelet transforms; automatic optical inspection system; cost reduction; feature extraction; image acquisition system; image processing; mounting defect detection; neural network; printed circuit board diagnosis; wavelet transform; Automatic optical inspection; Charge coupled devices; Charge-coupled image sensors; Contacts; Costs; Feature extraction; Neural networks; Pattern recognition; Printed circuits; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 2005. Fourtieth IAS Annual Meeting. Conference Record of the 2005
ISSN
0197-2618
Print_ISBN
0-7803-9208-6
Type
conf
DOI
10.1109/IAS.2005.1518381
Filename
1518381
Link To Document