• DocumentCode
    2196231
  • Title

    Low cost test solution for IDDQ

  • Author

    Thomas, Bob ; Andlauer, Rick

  • Author_Institution
    Cadence Design Syst. Inc., San Jose, CA, USA
  • fYear
    1996
  • fDate
    24-25 Oct. 1996
  • Firstpage
    50
  • Lastpage
    53
  • Abstract
    This paper describes a medium-speed, reliable and cost effective method of doing IDDQ testing. This method utilizes standard resources available on typical automatic test equipment (ATE) systems which do not have specialized IDDQ measurement hardware. This is a practical solution that can be implemented at a low cost and minimal resources.
  • Keywords
    automatic testing; integrated circuit testing; IDDQ testing; automatic test equipment; low cost technique; Circuit testing; Clamps; Costs; Current measurement; Force measurement; Measurement units; Phasor measurement units; Relays; System testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IDDQ Testing, 1996., IEEE International Workshop on
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    0-8186-7655-8
  • Type

    conf

  • DOI
    10.1109/IDDQ.1996.557813
  • Filename
    557813
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2196231