• DocumentCode
    2196381
  • Title

    Cooling rate dependence of microstructure and thermoelectric properties of AgPb18SbTe20 compounds

  • Author

    Yan, Yonggao ; Tang, Xinfeng ; Liu, Haijun ; Yin, Lingling ; Zhang, Qingjie

  • Author_Institution
    State Key Lab. of Adv. Technol. for Mater. Synthesis & Process., Wuhan Univ. of Technol., Wuhan
  • fYear
    2007
  • fDate
    3-7 June 2007
  • Firstpage
    61
  • Lastpage
    63
  • Abstract
    AgPb18SbTe20 samples were prepared by cooling from melts at three different rates as quenching, furnace cooling and controlled slow cooling rate of 10degC /h, and the correlation between cooling rates and samples microstructure and thermoelectric properties were discussed. Experimental results show that cooling rates influence significantly the microstructure and thermoelectric properties of the samples. As the cooling rate increased, an Ag-Sb-rich second phase occurred. Samples carrier concentration and electrical conductivity decrease with increased cooling rates and all samples measured have a negative Seebeck coefficient showing n-type conduction. At room temperature, the power factor of the slow cooled sample is 100 times that of the quench samples, and the ZT value of furnace cooled samples is much higher than that of the quenched samples. This results may explain why the samples several researchers prepared by different synthesis processes show very different ZT values.
  • Keywords
    Seebeck effect; antimony compounds; carrier density; crystal microstructure; electrical conductivity; lead compounds; melt processing; quenching (thermal); silver compounds; thermoelectric power; AgPb18SbTe20; Seebeck coefficient; ZT value; carrier concentration; cooling rate; electrical conductivity; furnace cooling; microstructure property; n-type conduction; power factor; quenching; slow cooling; temperature 293 K to 298 K; thermoelectric property; Conducting materials; Cooling; Furnaces; Microstructure; Plasma properties; Plasma temperature; Powders; Temperature dependence; Thermoelectricity; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 2007. ICT 2007. 26th International Conference on
  • Conference_Location
    Jeju Island
  • ISSN
    1094-2734
  • Print_ISBN
    978-1-4244-2262-3
  • Electronic_ISBN
    1094-2734
  • Type

    conf

  • DOI
    10.1109/ICT.2007.4569423
  • Filename
    4569423