• DocumentCode
    2196608
  • Title

    Experiments in high current switching using small contact gaps

  • Author

    Falkingham, Leslie T. ; Cheng, Kam

  • Author_Institution
    GEC Alsthom T&D Vacuum Equipment Ltd., Rugby, UK
  • Volume
    1
  • fYear
    1996
  • fDate
    21-26 Jul 1996
  • Firstpage
    345
  • Abstract
    A series of tests were performed on two types of commercial vacuum interrupters, herein called Type A and Type B to ascertain the effect of the contact gap on their high current interruption ability. The tests were carried out on a synthetic test plant at 12 kV, 31.5 kA for the Type A and 12 kV, 13.1 kA for the Type B, all values are rms. Three interrupters of each type were tested at contact gaps of between 8 mm and 1 mm. In addition, identical contacts were subjected to short circuit testing in a vacuum demountable chamber which allowed filming of the arc by means of a high speed camera. The results indicate that Type A showed a significant reduction in the probability of interruption of the rated short circuit current at contact gaps below 4 mm, whereas Type B showed no degradation at contact gaps down to 1 mm. The reasons for this are discussed
  • Keywords
    circuit-breaking arcs; high-speed optical techniques; short-circuit currents; switchgear testing; switching; vacuum arcs; vacuum interrupters; 1 to 8 mm; 12 kV; 13.1 kA; 31.5 kA; arc filming; high current interruption; high current switching; high speed camera; interruption probability; rated short circuit current; short circuit testing; small contact gaps; synthetic test plant; vacuum demountable chamber; vacuum interrupters; Cameras; Circuit testing; Contacts; Degradation; Geometry; Interrupters; Performance evaluation; Short circuit currents; Vacuum arcs; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 1996. Proceedings. ISDEIV., XVIIth International Symposium on
  • Conference_Location
    Berkeley, CA
  • Print_ISBN
    0-7803-2906-6
  • Type

    conf

  • DOI
    10.1109/DEIV.1996.545379
  • Filename
    545379