Title :
Test Technology Educational Program (TTEP) Tutorial 2
Abstract :
Provides an abstract for each of the presentations and a brief professional biography of each presenter. The complete presentations were not made available for publication as part of the conference proceedings.
Keywords :
CMOS technology; Circuit testing; Design engineering; Educational programs; Educational technology; Failure analysis; Microelectronics; Reliability engineering; Tutorial; Very large scale integration;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.104
