Title :
Fast Bridging Fault Diagnosis using Logic Information
Author :
Rousset, A. ; Bosio, A. ; Girard, P. ; Landrault, C. ; Pravossoudovitch, S. ; Virazel, A.
Author_Institution :
Univ. Montpellier, Montpellier
Abstract :
In this paper, we present a diagnosis methodology targeting the whole set of bridging faults leading to either static or dynamic faulty behavior. The adopted diagnosis algorithm resorts only to logic information provided by the tester without requiring a detailed description of the fault models. It is based on an Effect-Cause analysis providing a ranked list of suspects always including the root cause of the observed error. Experimental results on benchmarks ISCAS´89 and ITC ´99 show the efficiency of the proposed solution in terms of diagnosis resolution and required computational time.
Keywords :
benchmark testing; cause-effect analysis; fault diagnosis; logic circuits; effect-cause analysis; fault diagnosis; logic information; logic tester; Bridge circuits; Circuit faults; Circuit simulation; Circuit testing; Dictionaries; Failure analysis; Fault diagnosis; Logic circuits; Logic testing; Robots;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.75