DocumentCode :
2197092
Title :
Fault Dictionary Based Scan Chain Failure Diagnosis
Author :
Guo, Ruifeng ; Huang, Yu ; Cheng, Wu-Tung
Author_Institution :
Mentor Graphics Corp., Wilsonville
fYear :
2007
fDate :
8-11 Oct. 2007
Firstpage :
45
Lastpage :
52
Abstract :
In this paper, we present a fault dictionary based scan chain failure diagnosis technique. We first describe a technique to create small dictionaries for scan chain faults by storing differential signatures. Based on the differential signatures stored in a fault dictionary, we can quickly identify single stuck-at fault or timing fault in a faulty chain. We further develop a novel technique to diagnose some multiple stuck-at faults in a single scan chain. Comparing with fault simulation based diagnosis technique, the proposed fault dictionary based diagnosis technique is up to 130 times faster with same level of diagnosis accuracy and resolution.
Keywords :
failure analysis; fault simulation; logic testing; differential signatures; failure analysis; fault dictionary; fault simulation; industrial circuits; scan chain failure diagnosis; stuck-at fault; timing fault; Design for testability; Dictionaries; Failure analysis; Fault diagnosis; Graphics; Hardware; Manufacturing; Software testing; Timing; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
ISSN :
1081-7735
Print_ISBN :
978-0-7695-2890-8
Type :
conf
DOI :
10.1109/ATS.2007.43
Filename :
4387981
Link To Document :
بازگشت