DocumentCode
2197092
Title
Fault Dictionary Based Scan Chain Failure Diagnosis
Author
Guo, Ruifeng ; Huang, Yu ; Cheng, Wu-Tung
Author_Institution
Mentor Graphics Corp., Wilsonville
fYear
2007
fDate
8-11 Oct. 2007
Firstpage
45
Lastpage
52
Abstract
In this paper, we present a fault dictionary based scan chain failure diagnosis technique. We first describe a technique to create small dictionaries for scan chain faults by storing differential signatures. Based on the differential signatures stored in a fault dictionary, we can quickly identify single stuck-at fault or timing fault in a faulty chain. We further develop a novel technique to diagnose some multiple stuck-at faults in a single scan chain. Comparing with fault simulation based diagnosis technique, the proposed fault dictionary based diagnosis technique is up to 130 times faster with same level of diagnosis accuracy and resolution.
Keywords
failure analysis; fault simulation; logic testing; differential signatures; failure analysis; fault dictionary; fault simulation; industrial circuits; scan chain failure diagnosis; stuck-at fault; timing fault; Design for testability; Dictionaries; Failure analysis; Fault diagnosis; Graphics; Hardware; Manufacturing; Software testing; Timing; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location
Beijing
ISSN
1081-7735
Print_ISBN
978-0-7695-2890-8
Type
conf
DOI
10.1109/ATS.2007.43
Filename
4387981
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