• DocumentCode
    2197092
  • Title

    Fault Dictionary Based Scan Chain Failure Diagnosis

  • Author

    Guo, Ruifeng ; Huang, Yu ; Cheng, Wu-Tung

  • Author_Institution
    Mentor Graphics Corp., Wilsonville
  • fYear
    2007
  • fDate
    8-11 Oct. 2007
  • Firstpage
    45
  • Lastpage
    52
  • Abstract
    In this paper, we present a fault dictionary based scan chain failure diagnosis technique. We first describe a technique to create small dictionaries for scan chain faults by storing differential signatures. Based on the differential signatures stored in a fault dictionary, we can quickly identify single stuck-at fault or timing fault in a faulty chain. We further develop a novel technique to diagnose some multiple stuck-at faults in a single scan chain. Comparing with fault simulation based diagnosis technique, the proposed fault dictionary based diagnosis technique is up to 130 times faster with same level of diagnosis accuracy and resolution.
  • Keywords
    failure analysis; fault simulation; logic testing; differential signatures; failure analysis; fault dictionary; fault simulation; industrial circuits; scan chain failure diagnosis; stuck-at fault; timing fault; Design for testability; Dictionaries; Failure analysis; Fault diagnosis; Graphics; Hardware; Manufacturing; Software testing; Timing; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2007. ATS '07. 16th
  • Conference_Location
    Beijing
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-2890-8
  • Type

    conf

  • DOI
    10.1109/ATS.2007.43
  • Filename
    4387981