DocumentCode :
2197105
Title :
Test Education in the Global Economy
Author :
Cheng, Tonglei ; Abraham, Jibi ; Mir, Salvador ; Yinghua Min ; Wang, Jiacheng ; Cheng-Wen Wu
Author_Institution :
Univ. of California, Santa Barbara
fYear :
2007
fDate :
8-11 Oct. 2007
Firstpage :
53
Lastpage :
53
Abstract :
Summary form only given. There is an increasing demand for test and diagnosis expertise in the global semiconductor industry, in sectors ranging from foundries to test houses, to IDM companies, and from fabless design houses to EDA companies. Test education, however remains a niche, highly specialized subject area in the graduate curriculum and is seldom covered in undergraduate classes. In this panel, we evaluate the current health of academic test education and debate the role and goals of future test education, as well as those changes that need to be made to meet the global market demands.
Keywords :
educational courses; electronic engineering education; integrated circuit testing; EDA companies; IDM companies; academic test education; diagnosis expertise; electronic engineering education; global semiconductor industry; graduate curriculum; semiconductor testing; Asia; Educational technology; Electronic design automation and methodology; Electronics industry; Foundries; Globalization; Jacobian matrices; Semiconductor device testing; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
ISSN :
1081-7735
Print_ISBN :
978-0-7695-2890-8
Type :
conf
DOI :
10.1109/ATS.2007.110
Filename :
4387982
Link To Document :
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