DocumentCode
2197105
Title
Test Education in the Global Economy
Author
Cheng, Tonglei ; Abraham, Jibi ; Mir, Salvador ; Yinghua Min ; Wang, Jiacheng ; Cheng-Wen Wu
Author_Institution
Univ. of California, Santa Barbara
fYear
2007
fDate
8-11 Oct. 2007
Firstpage
53
Lastpage
53
Abstract
Summary form only given. There is an increasing demand for test and diagnosis expertise in the global semiconductor industry, in sectors ranging from foundries to test houses, to IDM companies, and from fabless design houses to EDA companies. Test education, however remains a niche, highly specialized subject area in the graduate curriculum and is seldom covered in undergraduate classes. In this panel, we evaluate the current health of academic test education and debate the role and goals of future test education, as well as those changes that need to be made to meet the global market demands.
Keywords
educational courses; electronic engineering education; integrated circuit testing; EDA companies; IDM companies; academic test education; diagnosis expertise; electronic engineering education; global semiconductor industry; graduate curriculum; semiconductor testing; Asia; Educational technology; Electronic design automation and methodology; Electronics industry; Foundries; Globalization; Jacobian matrices; Semiconductor device testing; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location
Beijing
ISSN
1081-7735
Print_ISBN
978-0-7695-2890-8
Type
conf
DOI
10.1109/ATS.2007.110
Filename
4387982
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