• DocumentCode
    2197105
  • Title

    Test Education in the Global Economy

  • Author

    Cheng, Tonglei ; Abraham, Jibi ; Mir, Salvador ; Yinghua Min ; Wang, Jiacheng ; Cheng-Wen Wu

  • Author_Institution
    Univ. of California, Santa Barbara
  • fYear
    2007
  • fDate
    8-11 Oct. 2007
  • Firstpage
    53
  • Lastpage
    53
  • Abstract
    Summary form only given. There is an increasing demand for test and diagnosis expertise in the global semiconductor industry, in sectors ranging from foundries to test houses, to IDM companies, and from fabless design houses to EDA companies. Test education, however remains a niche, highly specialized subject area in the graduate curriculum and is seldom covered in undergraduate classes. In this panel, we evaluate the current health of academic test education and debate the role and goals of future test education, as well as those changes that need to be made to meet the global market demands.
  • Keywords
    educational courses; electronic engineering education; integrated circuit testing; EDA companies; IDM companies; academic test education; diagnosis expertise; electronic engineering education; global semiconductor industry; graduate curriculum; semiconductor testing; Asia; Educational technology; Electronic design automation and methodology; Electronics industry; Foundries; Globalization; Jacobian matrices; Semiconductor device testing; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2007. ATS '07. 16th
  • Conference_Location
    Beijing
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-2890-8
  • Type

    conf

  • DOI
    10.1109/ATS.2007.110
  • Filename
    4387982