DocumentCode
2197124
Title
Improving Timing-Independent Testing of Crosstalk Using Realistic Assumptions on Delay Faults
Author
Irajpour, Shahdad ; Gupta, Sandeep K. ; Breuer, Melvin A.
Author_Institution
Univ. of Southern California, Los Angeles
fYear
2007
fDate
8-11 Oct. 2007
Firstpage
57
Lastpage
64
Abstract
Test generation methodology previously developed for crosstalk targets in the presence of manufacturing defects and process variations results in low coverage. In this paper, under a realistic assumption about the nature of manufacturing defects, we show that by incorporating two new concepts, namely, non- criticality and delay-superiority, significantly higher coverage of targets and lower test generation and test application costs are achieved.
Keywords
automatic test pattern generation; crosstalk; integrated circuit testing; crosstalk timing-independent testing; delay faults; manufacturing defects; test generation methodology; Chip scale packaging; Circuit faults; Circuit testing; Costs; Crosstalk; Delay; Integrated circuit interconnections; Manufacturing processes; Pulp manufacturing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location
Beijing
ISSN
1081-7735
Print_ISBN
978-0-7695-2890-8
Type
conf
DOI
10.1109/ATS.2007.86
Filename
4387983
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