• DocumentCode
    2197124
  • Title

    Improving Timing-Independent Testing of Crosstalk Using Realistic Assumptions on Delay Faults

  • Author

    Irajpour, Shahdad ; Gupta, Sandeep K. ; Breuer, Melvin A.

  • Author_Institution
    Univ. of Southern California, Los Angeles
  • fYear
    2007
  • fDate
    8-11 Oct. 2007
  • Firstpage
    57
  • Lastpage
    64
  • Abstract
    Test generation methodology previously developed for crosstalk targets in the presence of manufacturing defects and process variations results in low coverage. In this paper, under a realistic assumption about the nature of manufacturing defects, we show that by incorporating two new concepts, namely, non- criticality and delay-superiority, significantly higher coverage of targets and lower test generation and test application costs are achieved.
  • Keywords
    automatic test pattern generation; crosstalk; integrated circuit testing; crosstalk timing-independent testing; delay faults; manufacturing defects; test generation methodology; Chip scale packaging; Circuit faults; Circuit testing; Costs; Crosstalk; Delay; Integrated circuit interconnections; Manufacturing processes; Pulp manufacturing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2007. ATS '07. 16th
  • Conference_Location
    Beijing
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-2890-8
  • Type

    conf

  • DOI
    10.1109/ATS.2007.86
  • Filename
    4387983