DocumentCode :
2197124
Title :
Improving Timing-Independent Testing of Crosstalk Using Realistic Assumptions on Delay Faults
Author :
Irajpour, Shahdad ; Gupta, Sandeep K. ; Breuer, Melvin A.
Author_Institution :
Univ. of Southern California, Los Angeles
fYear :
2007
fDate :
8-11 Oct. 2007
Firstpage :
57
Lastpage :
64
Abstract :
Test generation methodology previously developed for crosstalk targets in the presence of manufacturing defects and process variations results in low coverage. In this paper, under a realistic assumption about the nature of manufacturing defects, we show that by incorporating two new concepts, namely, non- criticality and delay-superiority, significantly higher coverage of targets and lower test generation and test application costs are achieved.
Keywords :
automatic test pattern generation; crosstalk; integrated circuit testing; crosstalk timing-independent testing; delay faults; manufacturing defects; test generation methodology; Chip scale packaging; Circuit faults; Circuit testing; Costs; Crosstalk; Delay; Integrated circuit interconnections; Manufacturing processes; Pulp manufacturing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
ISSN :
1081-7735
Print_ISBN :
978-0-7695-2890-8
Type :
conf
DOI :
10.1109/ATS.2007.86
Filename :
4387983
Link To Document :
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