Title :
Identifiability analysis of linear time-delay systems
Author :
Orlov, Y. ; Belkoura, L. ; Richard, J.P. ; Dambrine, M.
Author_Institution :
Electron. & Telecommun. Dept., CICESE Res. Center, San Diego, CA, USA
Abstract :
Identifiability analysis is developed for linear time-delay systems with delayed states, control inputs and measured outputs, all with a finite number of lumped delays. These systems are governed by linear functional differential equations with uncertain time-invariant parameters and delays. It is shown that the transfer function of such a system admits the online identification if a sufficiently nonsmooth input signal is applied to the system. Sufficiently nonsmooth signals are constructively defined by imposing different smoothness properties on the control input and the state of the system. This definition is verified independently of any underlying time-delay system. By applying the theory developed to linear time-delay systems whose states are available to measurements with an a priori known sensor delay, the system parameters and delays are proven to be, in principle, identifiable if and only if the system is weakly controllable. Just in case, the parameter identifiability is also enforced by a sufficiently nonsmooth control input
Keywords :
delay systems; functional equations; linear differential equations; linear systems; parameter estimation; state estimation; transfer functions; delayed states; identifiability analysis; linear functional differential equations; linear time-delay systems; lumped delays; online identification; parameter estimation; parameter identifiability; sensor delay; state estimation; sufficiently nonsmooth control input; sufficiently nonsmooth signals; transfer function; uncertain time-invariant parameters; Centralized control; Control systems; Delay systems; Differential equations; Linear systems; Programmable control; Signal processing; State-space methods; Telecommunication control; Transfer functions;
Conference_Titel :
Decision and Control, 2001. Proceedings of the 40th IEEE Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-7061-9
DOI :
10.1109/.2001.980962