• DocumentCode
    2197437
  • Title

    Layout-Aware Multi-Layer Multi-Level Scan Tree Synthesis

  • Author

    Wang, Sying-Jyan ; Li, Xin-Long ; Li, Katherine Shu-Min

  • Author_Institution
    Nat. Chung Hsing Univ., Taichung
  • fYear
    2007
  • fDate
    8-11 Oct. 2007
  • Firstpage
    129
  • Lastpage
    134
  • Abstract
    In this paper, we propose a layout-aware scan tree synthesis methodology. Scan tree can greatly reduce test data volume, which is very desirable in SOC testing. However, previous researches on scan tree synthesis have not considered routing issues in physical design, which may create a tree with excessively long routing path. In this paper we present a multi-layer multi-level scan tree synthesis method, in which both data compression and routing length are taken into account. Experimental results show that the proposed test method achieves high compression rate with limited routing overhead.
  • Keywords
    data compression; high level synthesis; integrated circuit layout; integrated circuit testing; logic testing; network routing; system-on-chip; SOC testing; VLSI; data compression; layout-aware scan tree synthesis; multilayer multilevel scan tree synthesis; routing path; Broadcasting; Computer science; Data compression; Flip-flops; Multiplexing; Power engineering and energy; Routing; Switches; Test data compression; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2007. ATS '07. 16th
  • Conference_Location
    Beijing
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-2890-8
  • Type

    conf

  • DOI
    10.1109/ATS.2007.37
  • Filename
    4387997