• DocumentCode
    2197444
  • Title

    Solution growth and low-temperature thermoelectric properties of single crystalline β-FeSi2

  • Author

    Udono, H. ; Suzuki, H. ; Goto, K. ; Mashiko, S. ; Uchikoshi, M. ; Issiki, M.

  • Author_Institution
    Coll. of Eng., IBARAKI Univ., Hitachi
  • fYear
    2007
  • fDate
    3-7 June 2007
  • Firstpage
    241
  • Lastpage
    244
  • Abstract
    We have measured the Seebeck coefficient and power factor of single crystalline beta-FeSi2 grown by a temperature gradient solution growth (TGSG) method using Ga and Zn solvent. Typical resistivity and carrier density at 300 K were 0.03 Omegacm and 2times1019 cm-3 for p-type and 0.2 Omegacm and 5times1018 cm-3 for n-type crystals, respectively. The Seebeck coefficient measured along [011] direction was approximately 350 muV/K(p-type) and -700 mu;V/K(n-type) at 300 K and showed a maximum value of 500 mu;V/K(p-type, T=~25 K) and 2100 mu;V/K(n-type, T=~70 K). The maximum power factor was 4.2 times 10-6 Wcm-1K-2 (p-type, T=170 K) and 23 times 10-6 Wcm-1K-2 (n-type, T=100 K). The value was more than one order of magnitude larger than that of previously reported.
  • Keywords
    Seebeck effect; crystal growth from solution; electrical resistivity; iron compounds; power factor; semiconductor growth; semiconductor materials; FeSi2; Seebeck coefficient; [011] direction; carrier density; low-temperature thermoelectric property; n-type crystals; p-type crystals; power factor; resistivity; single crystalline solution growth; temperature 300 K; temperature gradient solution growth method; Charge carrier density; Conductivity; Crystallization; Crystals; Power measurement; Reactive power; Solvents; Temperature; Thermoelectricity; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 2007. ICT 2007. 26th International Conference on
  • Conference_Location
    Jeju Island
  • ISSN
    1094-2734
  • Print_ISBN
    978-1-4244-2262-3
  • Electronic_ISBN
    1094-2734
  • Type

    conf

  • DOI
    10.1109/ICT.2007.4569469
  • Filename
    4569469