Title :
A Test and Diagnosis Methodology for RF Transceivers
Author :
Chen, Hung-Kai ; Su, Chauchin
Author_Institution :
Nat. Chiao Tung Univ., Hsinchu
Abstract :
This paper proposes an RF test and diagnosis methodology based on digital DFT structure and built- in DSP function of a SoC Chip. Constellation variation plots are proposed to identify the faulty component. Furthermore, linear interpolation is used to determine the amount of variation. The simulated test results show that the method is able to identify not only the faulty component but also the variation amount precise.
Keywords :
digital signal processing chips; fault diagnosis; system-on-chip; transceivers; DSP function; RF transceivers; SoC chip; diagnosis methodology; digital DFT structure; linear interpolation; Circuit faults; Circuit testing; Costs; Digital signal processing; Fault diagnosis; Interpolation; RF signals; Radio frequency; Radiofrequency identification; Transceivers;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.29
