Title :
Next Generation Test, Diagnostics and Yield Challenges for EDA, ATE, IP and Fab - A Perspective from All Sides
Author :
Kohiyama, Yasuharu ; Ravikumar, C. ; Sato, Yasuo ; Wang, Laung-Terng ; Zorian, Yervant
Author_Institution :
Advantest, Japan
Abstract :
The Test industry has come a long way over the past few decades. As a whole we have made great strides in the areas of:
Keywords :
Automatic test pattern generation; Built-in self-test; Clocks; Costs; Electronic design automation and methodology; Instruments; Logic testing; Pressing; System testing; Test equipment;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing, China
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.111
