Title :
Experimental Results of Transition Fault Simulation with DC Scan Tests
Author :
Kawamura, Wataru ; Onodera, Takeshi
Author_Institution :
Sony Corp., Tokyo
Abstract :
The results indicate the effectiveness of the DC scan ATPG algorithm for transition fault detection in actual designs. Even though the at-speed toggle of the scan enable signal needs some DFT assistance such as pipelining, the classical DC scan ATPG algorithm seems worth considering for the first pass of AC scan ATPG runs.
Keywords :
automatic test pattern generation; boundary scan testing; fault simulation; logic testing; AC scan ATPG; DC scan ATPG algorithm; DC scan tests; transition fault detection; transition fault simulation; AC generators; Algorithm design and analysis; Automatic test pattern generation; Compaction; Costs; DC generators; Fault detection; Manufacturing; Semiconductor device testing; Test pattern generators;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.50
