Title :
Test Point Selections for a Programmable Gain Amplifier Using NIST and Wavelet Transform Methods
Author :
Zhang, Xinsong ; Ang, Simon S. ; Carter, Chandra
Author_Institution :
Univ. of Arkansas, Fayetteville
Abstract :
Test point selections for a programmable gain amplifier (PGA) using the National Institute of Standard (NIST) and wavelet transform methods are investigated. Although the wavelet transform method is an efficient method in test point selection for many mixed-signal devices, for a PGA with 31 input steps, the NIST method is shown to be more accurate in predicting the output gain responses than the wavelet transform method.
Keywords :
amplifiers; integrated circuit testing; mixed analogue-digital integrated circuits; programmable circuits; wavelet transforms; NIST; National Institute of Standard; PGA; mixed-signal devices; programmable gain amplifier; test point selections; wavelet transform methods; Automatic testing; Circuit testing; Electronics packaging; Gain measurement; NIST; Performance gain; Predictive models; USA Councils; Voltage; Wavelet transforms;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.28
