Title :
Jaggedness free C-OFDR for optical components characterization
Author :
Passy, R. ; von der Weid, J.P.
Author_Institution :
Group of Appl. Phys., Geneva Univ., Switzerland
Abstract :
High resolution and high sensitivity optical components characterization was performed with a jaggedness free coherent optical frequency domain reflectometry (OFDR) with multi-electrode DFB laser. The fading noise was reduced to less than 1 dB by using a double optical frequency sweep, improving the accuracy of insertion loss measurements. Sensitivities down to -105 dB were achieved with minute measurement times
Keywords :
distributed feedback lasers; light coherence; measurement by laser beam; optical communication equipment; optical elements; optical loss measurement; optical losses; reflectometry; broadband optical networks; coherent optical frequency domain reflectometry; double optical frequency sweep; fading noise; high resolution optical components; high sensitivity optical components; insertion loss measurement; jaggedness free C-OFDR; measurement times; multielectrode DFB laser; optical components; sensitivities; Fading; Frequency domain analysis; Insertion loss; Laser noise; Noise reduction; Optical devices; Optical losses; Optical noise; Optical sensors; Reflectometry;
Conference_Titel :
Microwave and Optoelectronics Conference, 1995. Proceedings., 1995 SBMO/IEEE MTT-S International
Conference_Location :
Rio de Janeiro
Print_ISBN :
0-7803-2674-1
DOI :
10.1109/SBMOMO.1995.509684
