Title :
Si/Ge nanodot superlattices for Si-based photovoltaics
Author :
Barletta, Philip ; Dezsi, Geza ; Lee, Minjoo ; Yi, Changhyun ; Venkatasubramanian, Rama
Author_Institution :
Center for Solid State Energetics, RTI Int., Research Triangle Park, NC, USA
Abstract :
We have grown Si/Ge nanodot superlattices via low-pressure chemical vapor deposition in order to analyze their performance as thin-film solar cells. Self-assembled Ge nanodots are included in the base region in order to boost absorption of near-infrared photons and to increase short-circuit current density, Jsc. At a relatively low dot density of 5.5 à 109 cm-2, both 20- and 40-period cells exhibited a fill factor of 70% and open-circuit voltage (Voc) of 0.51V, closely matching previously reported devices grown by molecular beam epitaxy. The 20- and 40-period cells had similar spectral responsivity for ¿ = 400-550 nm, but the thicker base of the 40-period cell enabled it to attain higher responsivity for wavelengths in the range of 550-900 nm. When we increased the dot density by 55% while holding the number of periods at 40, Voc dropped significantly due to a combination of lower bandgap and higher dislocation density. Work is in progress to integrate such SiGe-nano-materials based PV devices with ultra-thin Si PV, to obtain higher efficiencies as well as minimize the use of Si.
Keywords :
chemical vapour deposition; elemental semiconductors; germanium; nanofabrication; nanostructured materials; self-assembly; semiconductor growth; semiconductor superlattices; semiconductor thin films; silicon; solar cells; Si-Ge; Si-based photovoltaics; dislocation density; dot density; near-infrared photon absorption; open-circuit voltage; pressure chemical vapor deposition; self-assembled nanodot superlattices; short-circuit current density; spectral responsivity; thin-film solar cells; wavelength 400 nm to 900 nm; Absorption; Chemical analysis; Chemical vapor deposition; Current density; Performance analysis; Photovoltaic cells; Self-assembly; Semiconductor thin films; Sputtering; Superlattices;
Conference_Titel :
IEEE SoutheastCon 2010 (SoutheastCon), Proceedings of the
Conference_Location :
Concord, NC
Print_ISBN :
978-1-4244-5854-7
DOI :
10.1109/SECON.2010.5453843