Title :
Optical low coherence reflectometry for characterization of optical devices
Author :
da Silva, J.A.P. ; Prola, C.H., Jr. ; von der Weid, J.P.
Author_Institution :
Centro de Estudos em Telecommunicacoes, Pontificia Univ. Catolica do Rio de Janeiro, Brazil
Abstract :
A new OLCR configuration, which places the device out of both arms of the Michelson interferometer was demonstrated. By modulating the device-fiber distance the plurality of solutions can be solved. Resolution of 2.5 μm and sensitivity of -100 dB enables the system for characterization of optical waveguides
Keywords :
Michelson interferometers; light coherence; optical fibres; optical modulation; optical testing; optical waveguides; reflectometry; Michelson interferometer; device-fiber distance modulation; optical devices; optical low coherence reflectometry; optical waveguides; resolution; sensitivity; Arm; Coherence; Interference; Light sources; Optical devices; Optical interferometry; Optical modulation; Optical sensors; Optical waveguides; Reflectometry;
Conference_Titel :
Microwave and Optoelectronics Conference, 1995. Proceedings., 1995 SBMO/IEEE MTT-S International
Conference_Location :
Rio de Janeiro
Print_ISBN :
0-7803-2674-1
DOI :
10.1109/SBMOMO.1995.509685
