DocumentCode
2198015
Title
Optical low coherence reflectometry for characterization of optical devices
Author
da Silva, J.A.P. ; Prola, C.H., Jr. ; von der Weid, J.P.
Author_Institution
Centro de Estudos em Telecommunicacoes, Pontificia Univ. Catolica do Rio de Janeiro, Brazil
Volume
2
fYear
1995
fDate
24-27 Jul 1995
Firstpage
596
Abstract
A new OLCR configuration, which places the device out of both arms of the Michelson interferometer was demonstrated. By modulating the device-fiber distance the plurality of solutions can be solved. Resolution of 2.5 μm and sensitivity of -100 dB enables the system for characterization of optical waveguides
Keywords
Michelson interferometers; light coherence; optical fibres; optical modulation; optical testing; optical waveguides; reflectometry; Michelson interferometer; device-fiber distance modulation; optical devices; optical low coherence reflectometry; optical waveguides; resolution; sensitivity; Arm; Coherence; Interference; Light sources; Optical devices; Optical interferometry; Optical modulation; Optical sensors; Optical waveguides; Reflectometry;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Optoelectronics Conference, 1995. Proceedings., 1995 SBMO/IEEE MTT-S International
Conference_Location
Rio de Janeiro
Print_ISBN
0-7803-2674-1
Type
conf
DOI
10.1109/SBMOMO.1995.509685
Filename
509685
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