• DocumentCode
    2198289
  • Title

    A single six-port reflectometer measures the scattering parameters of two-port microwave devices

  • Author

    de Oliveira, Antonio Jeronimo Belfort ; Neto, Sérgio Pedro Xavier

  • Author_Institution
    Dept. de Electron. e Sistemas, Univ. Federal de Pernambuco, Brazil
  • Volume
    2
  • fYear
    1995
  • fDate
    24-27 Jul 1995
  • Firstpage
    671
  • Abstract
    A single six-port reflectometer configuration is proposed to measure the four scattering parameters of two-port microwave devices. In order to determine the transmission coefficients, only one calibration standard and three measurements are required to complete the calibration procedure. Furthermore, s12 and s21 can be measured without reversing the device under test
  • Keywords
    S-parameters; calibration; measurement standards; microwave devices; microwave reflectometry; multiport networks; network analysis; calibration standard; network analyser; s12 measurement; s21 measurement; scattering parameter measurement; single six-port reflectometer; transmission coefficients; two-port microwave devices; Calibration; Circuits; Isolators; Measurement standards; Microwave devices; Microwave measurements; Microwave theory and techniques; Reflection; Scattering parameters; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Optoelectronics Conference, 1995. Proceedings., 1995 SBMO/IEEE MTT-S International
  • Conference_Location
    Rio de Janeiro
  • Print_ISBN
    0-7803-2674-1
  • Type

    conf

  • DOI
    10.1109/SBMOMO.1995.509698
  • Filename
    509698
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2198289