DocumentCode :
2198412
Title :
Testing RF Components with Supply Current Signatures
Author :
Akbay, S. Sermet ; Sen, Shreyas ; Chatterjee, Abhijit
Author_Institution :
Georgia Inst. of Technol., Atlanta
fYear :
2007
fDate :
8-11 Oct. 2007
Firstpage :
393
Lastpage :
398
Abstract :
We propose a technique for low-cost testing of radio-frequency components integrating current signatures and alternate test methodology. The technique is suitable for non-invasive built-in test as well as low-cost automated test equipment (ATE) applications. Main features of the technique are (1) minimum loading on signal path by sampling supply current, (2) flexible test stimulus generation based on system constraints, (3) test time reduction by using a single test stimulus and data acquisition, and (4) accurate prediction of all specification values from the single excitation. Two experiments using the proposed implementation demonstrate the accuracy and efficiency of the technique on both single-balanced and double-balanced mixers built with two different technologies.
Keywords :
automatic test equipment; built-in self test; electric current measurement; RF component supply current signatures; automated test equipment; built-in self test; current measurement; radiofrequency components; test time reduction; Area measurement; Automatic testing; Built-in self-test; Circuit testing; Cost function; Current supplies; Packaging; Radio frequency; Signal generators; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
ISSN :
1081-7735
Print_ISBN :
978-0-7695-2890-8
Type :
conf
DOI :
10.1109/ATS.2007.87
Filename :
4388044
Link To Document :
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