DocumentCode :
2198426
Title :
Analysis of E-plane discontinuities of bilateral metal septa with finite conductivity
Author :
Xu, Jin-Ping ; Liang, Chang-Hong
Author_Institution :
Dept. of Electron. Eng., Nanjing Univ. of Aeronaut. & Astronaut., China
Volume :
2
fYear :
1995
fDate :
24-27 Jul 1995
Firstpage :
705
Abstract :
The equivalent lossy T-network parameters of E-plane discontinuities (in rectangular waveguides) of bilateral metal septa with finite conductivity are calculated by the method of lines. An efficient approach is presented to extend this numerical method to EM boundary value problems with imperfectly conducting metal boundaries parallel to the discretization lines. Numerical results of both equivalent reactances and resistances in the T-network are obtained. The calculated insertion losses of a Ka-band filter based on the lossy equivalent circuit fit better with the published experimental results than what have been obtained based on a lossless equivalent circuit
Keywords :
boundary-value problems; electric reactance; electric resistance; electrical conductivity; equivalent circuits; fin line components; microwave filters; network parameters; rectangular waveguides; resonator filters; waveguide discontinuities; waveguide filters; waveguide theory; E-plane discontinuities; EM boundary value problems; Ka-band filter; bilateral metal septa; discretization lines; equivalent lossy T-network parameters; equivalent reactance; equivalent resistance; experimental results; fin line filter; finite conductivity; imperfectly conducting metal boundaries; insertion losses; lossless equivalent circuit; lossy equivalent circuit; method of lines; numerical method; numerical results; rectangular waveguides; resonator filter; Band pass filters; Boundary value problems; Conductivity; Differential equations; Electromagnetic fields; Electromagnetic waveguides; Equivalent circuits; Geometry; Insertion loss; Resonator filters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Optoelectronics Conference, 1995. Proceedings., 1995 SBMO/IEEE MTT-S International
Conference_Location :
Rio de Janeiro
Print_ISBN :
0-7803-2674-1
Type :
conf
DOI :
10.1109/SBMOMO.1995.509703
Filename :
509703
Link To Document :
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