Title :
Implementation of Defect Oriented Testing and ICCQ testing for industrial mixed-signal IC
Author :
Liquan Fang ; Yang Zhong ; van de Donk, H. ; Yizi Xing
Author_Institution :
NXP Semicond., Nijmegen
Abstract :
In the era of Zero Defects, ICCQ is one of the powerful non-specification based testing methods to achieve high test coverage and supreme product quality. Within this project, based on the fault simulation with Defect Oriented Test (DOT) technique, the current tests with the most efficient coverage improvements have been selected and implemented in the production testing flow.
Keywords :
electric current measurement; fault simulation; integrated circuit manufacture; integrated circuit measurement; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; ICCQ testing; defect oriented testing; fault simulation; industrial mixed-signal IC; nonspecification based testing methods; production testing flow; Automatic testing; Circuit faults; Circuit testing; Current measurement; Integrated circuit testing; Power supplies; Production; Semiconductor device testing; System testing; US Department of Transportation;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.93
