DocumentCode
2198460
Title
Implementation of Defect Oriented Testing and ICCQ testing for industrial mixed-signal IC
Author
Liquan Fang ; Yang Zhong ; van de Donk, H. ; Yizi Xing
Author_Institution
NXP Semicond., Nijmegen
fYear
2007
fDate
8-11 Oct. 2007
Firstpage
404
Lastpage
412
Abstract
In the era of Zero Defects, ICCQ is one of the powerful non-specification based testing methods to achieve high test coverage and supreme product quality. Within this project, based on the fault simulation with Defect Oriented Test (DOT) technique, the current tests with the most efficient coverage improvements have been selected and implemented in the production testing flow.
Keywords
electric current measurement; fault simulation; integrated circuit manufacture; integrated circuit measurement; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; ICCQ testing; defect oriented testing; fault simulation; industrial mixed-signal IC; nonspecification based testing methods; production testing flow; Automatic testing; Circuit faults; Circuit testing; Current measurement; Integrated circuit testing; Power supplies; Production; Semiconductor device testing; System testing; US Department of Transportation;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location
Beijing
ISSN
1081-7735
Print_ISBN
978-0-7695-2890-8
Type
conf
DOI
10.1109/ATS.2007.93
Filename
4388046
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